Part Number Manufacturer / Brand Brife Description Part StatusLogic TypeSupply VoltageNumber of BitsOperating TemperatureMounting TypePackage / CaseSupplier Device Package
Texas Instruments IC SCAN TEST DEVICE BUFF 24-SOIC ActiveScan Test Device with Buffers4.5 V ~ 5.5 V80°C ~ 70°CSurface Mount24-SOIC (0.295", 7.50mm Width)24-SOIC
Texas Instruments IC SCAN TEST DEVICE BUFF 24-SOIC Discontinued at -Scan Test Device with Buffers4.5 V ~ 5.5 V80°C ~ 70°CSurface Mount24-SOIC (0.295", 7.50mm Width)24-SOIC