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  1. Casa
  2. Productos
  3. Circuitos integrados
  4. Interfaz - Telecomunicaciones
  5. Bit

Bit Interfaz - Telecomunicaciones

OptoelectronicsSensors, TransducersIntegrated Circuits (ICs)RF/IF and RFIDPassive Components
  • Display Modules - LCD, OLED, Graphic
  • Encoders
  • Pressure Sensors, Transducers
  • Embedded - Microcontrollers
  • Data Acquisition - Analog to Digital Converters (ADC)
  • Data Acquisition - Digital to Analog Converters (DAC)
  • Interface - Telecom
  • Logic - Flip Flops
  • Logic - Latches
  • Interface - Drivers, Receivers, Transceivers
  • Logic - Shift Registers
  • Interface - CODECs
  • Clock/Timing - Clock Generators, PLLs, Frequency Synthesizers
  • PMIC - Display Drivers
  • Logic - Counters, Dividers
  • Logic - Translators, Level Shifters
  • Logic - Signal Switches, Multiplexers, Decoders
  • Interface - I/O Expanders
  • Interface - Controllers
  • Interface - Specialized
  • Interface - Serializers, Deserializers
  • Data Acquisition - ADCs/DACs - Special Purpose
  • Embedded - Microcontrollers - Application Specific
  • Memory
  • RF Misc ICs and Modules
  • RF Switches
  • SAMSUNG Components
  • VISHAY Components
Número de pieza Fabricante / Marca Breve descripción
DS21372T
Maxim Integrated IC TESTER BIT ERROR 3.3V 32-TQFP
DS21372T+
Maxim Integrated IC TESTER BIT ERROR 3.3V 32-TQFP
DS21372TN
Maxim Integrated IC TESTER BIT ERROR 3.3V 32-TQFP
DS21372TN+
Maxim Integrated IC TESTER BIT ERROR 3.3V 32-TQFP
DS2172T
Maxim Integrated IC TESTER BIT ERROR RATE 32-TQFP
DS2172T+
Maxim Integrated IC TESTER BIT ERROR RATE 32-TQFP
DS2172T+T&R
Maxim Integrated IC TESTER BIT ERROR RATE 32-TQFP
DS2172T/T&R
Maxim Integrated IC TESTER BIT ERROR RATE 32-TQFP
DS2172TN
Maxim Integrated IC TESTER BIT ERROR RATE 32-TQFP
DS2172TN+
Maxim Integrated IC TESTER BIT ERROR RATE 32-TQFP
DS2172TN+T&R
Maxim Integrated IC BIT ERROR RATE TESTER 32TQFP
VSC8479YHQ-01
Microsemi Corporation 16 BIT SFI4.1 10G SERDES 12X12MM
VSC8479YHQ-02
Microsemi Corporation FAST LOCK 16 BIT SFI4.1 10G SERD
Email: [email protected]
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