Part Number Manufacturer / Brand Brife Description Part StatusLogic TypeSupply VoltageNumber of BitsOperating TemperatureMounting TypePackage / CaseSupplier Device Package
Texas Instruments IC SCAN TEST DEVICE BUFF 24-SOIC ObsoleteScan Test Device with Inverting Buffers4.5 V ~ 5.5 V80°C ~ 70°CSurface Mount24-SOIC (0.295", 7.50mm Width)24-SOIC
Texas Instruments IC SCAN TEST DEVICE BUFF 24-SOIC ActiveScan Test Device with Buffers4.5 V ~ 5.5 V80°C ~ 70°CSurface Mount24-SOIC (0.295", 7.50mm Width)24-SOIC
Texas Instruments IC SCAN TEST DEVICE BUFF 24-SOIC Discontinued at -Scan Test Device with Buffers4.5 V ~ 5.5 V80°C ~ 70°CSurface Mount24-SOIC (0.295", 7.50mm Width)24-SOIC
Texas Instruments IC SCAN TEST DEVICE TXRX 24-SOIC ActiveScan Test Device with Bus Transceivers4.5 V ~ 5.5 V80°C ~ 70°CSurface Mount24-SOIC (0.295", 7.50mm Width)24-SOIC
Texas Instruments IC SCAN TEST DEVICE LATCH 24SOIC ObsoleteScan Test Device with D-Type Latches4.5 V ~ 5.5 V80°C ~ 70°CSurface Mount24-SOIC (0.295", 7.50mm Width)24-SOIC
Texas Instruments IC TEST-BUS CONTROLLER 24-SOIC ActiveEmbedded Test-Bus Controllers2.7 V ~ 3.6 V8-40°C ~ 85°CSurface Mount24-SOIC (0.295", 7.50mm Width)24-SOIC
Texas Instruments IC TEST-BUS CONTROLLER 24-SOIC ActiveEmbedded Test-Bus Controllers2.7 V ~ 3.6 V8-40°C ~ 85°CSurface Mount24-SOIC (0.295", 7.50mm Width)24-SOIC
Texas Instruments IC 10-BIT SCAN PORT XCVR 24-SOIC ActiveAddressable Scan Ports2.7 V ~ 3.6 V10-40°C ~ 85°CSurface Mount24-SOIC (0.295", 7.50mm Width)24-SOIC
Texas Instruments IC 10-BIT SCAN PORT XCVR 24-SOIC ActiveAddressable Scan Ports2.7 V ~ 3.6 V10-40°C ~ 85°CSurface Mount24-SOIC (0.295", 7.50mm Width)24-SOIC