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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
Obsolete | Scan Test Device with Inverting Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
Active | Scan Test Device with Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
Discontinued at - | Scan Test Device with Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC SCAN TEST DEVICE TXRX 24-SOIC |
Active | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC SCAN TEST DEVICE LATCH 24SOIC |
Obsolete | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC TEST-BUS CONTROLLER 24-SOIC |
Active | Embedded Test-Bus Controllers | 2.7 V ~ 3.6 V | 8 | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC TEST-BUS CONTROLLER 24-SOIC |
Active | Embedded Test-Bus Controllers | 2.7 V ~ 3.6 V | 8 | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC 10-BIT SCAN PORT XCVR 24-SOIC |
Active | Addressable Scan Ports | 2.7 V ~ 3.6 V | 10 | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC 10-BIT SCAN PORT XCVR 24-SOIC |
Active | Addressable Scan Ports | 2.7 V ~ 3.6 V | 10 | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |