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ON Semiconductor |
TXRX TRANSLATING IEEE 48TSSOP |
Obsolete | IEEE STD 1284 Translation Transceiver | 3 V ~ 3.6 V | 8 | -40°C ~ 85°C | Surface Mount | 48-TFSOP (0.240", 6.10mm Width) | 48-TSSOP |
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ON Semiconductor |
TXRX TRANSLATING IEEE 48SSOP |
Obsolete | IEEE STD 1284 Translation Transceiver | 3 V ~ 3.6 V | 8 | -40°C ~ 85°C | Surface Mount | 48-BSSOP (0.295", 7.50mm Width) | 48-SSOP |
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ON Semiconductor |
TXRX TRANSLATING IEEE 48TSSOP |
Obsolete | IEEE STD 1284 Translation Transceiver | 3 V ~ 3.6 V | 8 | -40°C ~ 85°C | Surface Mount | 48-TFSOP (0.240", 6.10mm Width) | 48-TSSOP |
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ON Semiconductor |
TXRX TRANSLATING IEEE 48TSSOP |
Active | IEEE STD 1284 Translation Transceiver | 3 V ~ 3.6 V | 8 | -40°C ~ 85°C | Surface Mount | 48-TFSOP (0.240", 6.10mm Width) | 48-TSSOP |
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ON Semiconductor |
TXRX BIDIRECT IEEE 48SSOP |
Obsolete | IEEE STD 1284 Translation Transceiver | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | Surface Mount | 48-BSSOP (0.295", 7.50mm Width) | 48-SSOP |
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Texas Instruments |
IC TERMINATOR PROG DUAL 14-DIP |
Active | Programmable Terminator | 3 V ~ 18 V | 8 | -55°C ~ 125°C | Through Hole | 14-DIP (0.300", 7.62mm) | 14-PDIP |
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Texas Instruments |
IC TERMINATOR PROG DUAL 14-SOIC |
Obsolete | Programmable Terminator | 3 V ~ 18 V | 8 | -55°C ~ 125°C | Surface Mount | 14-SOIC (0.154", 3.90mm Width) | 14-SOIC |
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
Obsolete | Scan Test Device with Inverting Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
Active | Scan Test Device with Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
Discontinued at - | Scan Test Device with Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC SCAN TEST DEVICE TXRX 24-SOIC |
Active | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC SCAN TEST DEVICE LATCH 24SOIC |
Obsolete | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC 8-BIT TXCVR 52-QFP |
Obsolete | TTL/BTL Registered Transceiver | 4.75 V ~ 5.25 V | 8 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
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Texas Instruments |
IC REGISTERED TXRX 8BIT 52-QFP |
Obsolete | TTL/BTL Registered Transceiver | 4.75 V ~ 5.25 V | 8 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
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Texas Instruments |
IC REGISTERED TXRX 8BIT 52QFP |
Active | TTL/BTL Registered Transceiver | 4.75 V ~ 5.25 V | 8 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
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Texas Instruments |
IC 8-BIT TTL/BTL XCVR 52-QFP |
Obsolete | TTL/BTL Transceiver/Translator | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
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Texas Instruments |
IC TEST-BUS CONTROLLER 24-SOIC |
Active | Embedded Test-Bus Controllers | 2.7 V ~ 3.6 V | 8 | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC TEST-BUS CONTROLLER 24-SOIC |
Active | Embedded Test-Bus Controllers | 2.7 V ~ 3.6 V | 8 | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
