|
|
Texas Instruments |
IC SCAN TEST DEVICE 18BIT 64LQFP |
Active | Scan Test Device with Registered Bus Transceiver | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
|
|
Texas Instruments |
IC SCAN-TEST-DEV/TXRX 64-LQFP |
Active | Scan Test Device With Transceivers And Registers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
|
|
Texas Instruments |
IC SCAN-TEST-DEV/TXRX 64-LQFP |
Active | Scan Test Device With Transceivers And Registers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
|
|
Texas Instruments |
IC SCAN-TEST-DEV/TXRX 64-LQFP |
Active | Scan Test Device With Transceivers And Registers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
|
|
Texas Instruments |
IC LINK ADDRSS SCAN-PORT 64-LQFP |
Active | Linking Addressable Scan Ports | 2.7 V ~ 3.6 V | - | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
|
|
Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 20 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
|
|
Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
|
|
Texas Instruments |
IC 18BIT SCAN TST DEV UBT 64LQFP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
|
|
Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 20 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
|
|
Texas Instruments |
IC 20BIT SCAN TST DEV UBT 64LQFP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 20 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
