Numéro d'article Fabricant / marque Brève description État de la pièceType de logiqueTension d'alimentationNombre de bitsTempérature de fonctionnementType de montagePaquet / casPackage de périphérique fournisseur
Texas Instruments IC SCAN-TEST-DEV/XCVR 64-LQFP ActiveABT Scan Test Device With Universal Bus Transceivers2.7 V ~ 3.6 V20-40°C ~ 85°CSurface Mount64-LQFP64-LQFP (10x10)
Texas Instruments IC SCAN-TEST-DEV/XCVR 64-TSSOP ActiveABT Scan Test Device With Universal Bus Transceivers2.7 V ~ 3.6 V18-40°C ~ 85°CSurface Mount64-TFSOP (0.240", 6.10mm Width)64-TSSOP
Texas Instruments IC SCAN-TEST-DEV/XCVR 64-LQFP ActiveABT Scan Test Device With Universal Bus Transceivers2.7 V ~ 3.6 V18-40°C ~ 85°CSurface Mount64-LQFP64-LQFP (10x10)
Texas Instruments IC 18BIT SCAN TST DEV UBT 64LQFP ActiveABT Scan Test Device With Universal Bus Transceivers2.7 V ~ 3.6 V18-40°C ~ 85°CSurface Mount64-LQFP64-LQFP (10x10)
Texas Instruments IC SCAN-TEST-DEV/XCVR 64-LQFP ActiveABT Scan Test Device With Universal Bus Transceivers2.7 V ~ 3.6 V20-40°C ~ 85°CSurface Mount64-LQFP64-LQFP (10x10)
Texas Instruments IC 20BIT SCAN TST DEV UBT 64LQFP ActiveABT Scan Test Device With Universal Bus Transceivers2.7 V ~ 3.6 V20-40°C ~ 85°CSurface Mount64-LQFP64-LQFP (10x10)