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Texas Instruments |
IC TEST-BUS CONTROLLER 24-SOIC |
Active | Embedded Test-Bus Controllers | 2.7 V ~ 3.6 V | 8 | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC TEST-BUS CONTROLLER 24-SOIC |
Active | Embedded Test-Bus Controllers | 2.7 V ~ 3.6 V | 8 | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC LINK ADDRSS SCAN-PORT 64-LQFP |
Active | Linking Addressable Scan Ports | 2.7 V ~ 3.6 V | - | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Texas Instruments |
IC LINK ADDRSS SCAN-PORT 64-BGA |
Active | Linking Addressable Scan Ports | 2.7 V ~ 3.6 V | - | -40°C ~ 85°C | Surface Mount | 64-LFBGA | 64-BGA MICROSTAR (8x8) |
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Texas Instruments |
IC 10-BIT SCAN PORT XCVR 24-SOIC |
Active | Addressable Scan Ports | 2.7 V ~ 3.6 V | 10 | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC 10-BIT SCAN PORT XCVR 24-SOIC |
Active | Addressable Scan Ports | 2.7 V ~ 3.6 V | 10 | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC 10-BIT SCAN PORT XCVR 24TSSOP |
Active | Addressable Scan Ports | 2.7 V ~ 3.6 V | 10 | -40°C ~ 85°C | Surface Mount | 24-TSSOP (0.173", 4.40mm Width) | 24-TSSOP |
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Texas Instruments |
IC 10-BIT SCAN PORT XCVR 24TSSOP |
Active | Addressable Scan Ports | 2.7 V ~ 3.6 V | 10 | -40°C ~ 85°C | Surface Mount | 24-TSSOP (0.173", 4.40mm Width) | 24-TSSOP |
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Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 20 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-TSSOP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-TFSOP (0.240", 6.10mm Width) | 64-TSSOP |
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Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Texas Instruments |
IC 18BIT SCAN TST DEV UBT 64LQFP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 20 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Texas Instruments |
IC 20BIT SCAN TST DEV UBT 64LQFP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 20 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |